Riegl USA to attend the International Lidar Mapping Forum 2011

Riegl USA will be attending the International Lidar Mapping Forum 2011 in New Orleans on February 7th thru February 9th.  Presenting for Riegl  is Dr. Ullrich, CTO for Riegl Laser Measurement Systems GmbH on Multi-Wavelength AirborneLaser Scanning on February 8th at 4:30 pm.  Presenting for Riegl USA is Ananda Fowler, Manager of Stationery Terrestrial Systems on Accuracy and Error Assessment of Terrestrial, Mobile and Airborne LiDAR on February 8th at 2:30 pm.  Also, presenting in the Basics to Lidar Workshop Series, Joshua France, Applications – Systems Engineer for Riegl USA.  His Workshop topic is on Riegl LiDAR Applications and is on February 7th from 2:00 – 3:00 pm. 

Please stop by our new and exciting booth that is located outside of the exhibit hall at booth #48.

For more information about the International Lidar Mapping Forum 2011 please click on the Blogroll Link.

Leave a Reply!

Fill in your details below or click an icon to log in:

WordPress.com Logo

You are commenting using your WordPress.com account. Log Out / Change )

Twitter picture

You are commenting using your Twitter account. Log Out / Change )

Facebook photo

You are commenting using your Facebook account. Log Out / Change )

Google+ photo

You are commenting using your Google+ account. Log Out / Change )

Connecting to %s